ULINKplus: Compact debug adapter with test I/O and power measurement

Ultra-low power applications require careful software validation to achieve long battery lifetimes and sensitive hardware needs electrical isolated test connections to prevent from interference voltages. Test automation and scripted testing need ways to interact with the unit under test, for example to stimulate input pins of the target application.

At embedded world, Arm introduces the new Keil ULINKplus debug/trace adapter with innovative features solving all these problems:

• Integrated power measurement synchronized to event tracing which makes it easy to optimize the overall energy envelope of a system.
• Isolated JTAG/serial-wire connection to the target hardware is essential for testing applications such as motor control, power converters, or systems with sensitive analog processing.
• Additional test I/O pins are accessible from the debugger and debug scripts to interact with the target and control automated test stands.

ULINKplus connects to Arm Cortex processors and offers multi-core debugging. It uses the CMSIS-DAP interface which is widely supported by many debuggers.

Versatile functions in a compact enclosure: ULINKplus

Power Measurement

The 3-pin power measurement interface is 1 kV isolated. The µVision debugger captures the voltage and current input from the device and displays it in a built-in analyzer:

Live data from power measurement

Test Automation

The test I/O pins can be connected to the target system and allow you to control automated tests. The µVision gives you direct access to these I/O pins using a dialog or virtual debug registers that are accessible via a scripting language.

Graphical configuration of I/O pins

ULINKplus technical data

• Compact case 62 x 44 x 11 mm (dust-protected)
• JTAG/SWD: 20 MHz JTAG clock, 50 MHz serial-wire trace, 10-pin Cortex debug connector, 1 kV isolation
• Memory access 3 MB/sec, serial-wire trace up to 50 Mbit/sec
• Power measurement: 2 x 16-bit A/D, 400 ksamples/sec, 3-pin connector, 1 kV isolation
• Test I/O: 9 digital in/out, 4 analog in, 1 analog out, 3.3 V switchable output voltage (11-pin connector)
• Debug connection: USB2.0 (to host PC), CMSIS-DAP protocol

embedded world 2017

The Keil MDK demos at the embedded world trade show in Nuremberg (March 14th - 16th) will be using ULINKplus. Please visit us at Arm's booth in hall 3/stand 342. 

Availability

ULINKplus will be available from May 2017.