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Flash reliability problems

We are using a LPC2138
I have just received a batch of boards that fail functional test.
When I reprogram the binary, they work perfectly.
So I have read back the contents of a failing board and compared it to a binary read back after I reprogram the board.
They are identical.

The LPC2138 errata sheet does list an error for the MAM which
"Under certain conditions when the MAM is fully enabled (Mode 2) code execution from internal Flash can fail."

However, this does not explain why it works when I reprogram the boards. Also the boards do not crash.

Is there anything else I can test before I re-program them all?

Parents
  • You can't control the programming voltage. It is generated internally. But it is important that the processor has a reasonable temperature, and a stable (and correct) external supply voltage and that the clock frequency is correct (and matches what is assumed) during the programming.

    If the external voltage varies, the internal voltage pump may not be able to produce a stable programming voltage.

    If the temperature is too high, the programming algorithm may fail.

    If the clock frequency is wrong, then the programming algorithm may erase the flash sector for too short time or may write the data with wrong timing.

Reply
  • You can't control the programming voltage. It is generated internally. But it is important that the processor has a reasonable temperature, and a stable (and correct) external supply voltage and that the clock frequency is correct (and matches what is assumed) during the programming.

    If the external voltage varies, the internal voltage pump may not be able to produce a stable programming voltage.

    If the temperature is too high, the programming algorithm may fail.

    If the clock frequency is wrong, then the programming algorithm may erase the flash sector for too short time or may write the data with wrong timing.

Children