Hi! On PowerOn my C167CR-LM should do some RAM-checks. Writing procedures for testing external RAM and nonvolatile RAM (using idata-Variables and internal registers) is done, but how can I test the internal area? I'm using the following tests: 1st: Walking 0s/1s over the adressbus 2nd: Simple Adress-Test over der whole external RAM and NVRAM (writing their own address into each cell and checking it after all cells were written) .. this test is done 3 times by Byte-shifting the addresses 3rd: Cell-Test (writing 0x55 / 0xAA to each location and testing them after all cells were written) Is their a GOOD non-destructive RAM-Test or how could I do a destructive IRAM-Test on PowerOn? Thanks for any answers Torsten
Thanks a lot for the fast replies! I will read those articles/threads and come back if there are more questions :) Torsten
Is there a point in testing on-chip RAM? I would imagine the CPU takes up as much silicon area as on-chip RAM in C167CR-LM. After all, if you think that the silicon can be faulty you might as well test the CPU. Maybe it's all not worth the trouble? - mike
If you have to develop a medical product and if the product may cause accidents on a patient you HAVE to test the whole memory (at least here in Germany *g*) ! The memory-checks are only part of a whole lot of several PowerOn- and Runtime-Tests. Torsten
Agreed. The more testing here, the better. There is a bit of sad irony in the fact that weapons and medical equipment are among the most demanding in terms of reliability...