What exactly is the "usage model" of ARMv8 SVE contiguous "non-fault" load instructions ?
I understand the usage model of "first-fault" SVE instrcutions (which is described in many white papers) but the "usage model" of ARMv8 SVE contiguous "non-fault" load instructions is not clear to me.
What I am looking for is the example of why this instruction is useful (i.e. why it has been introduced in the SVE instruction set).
For instance, for the "first-fault" load SVE instructions the usage model is the implementation of the loops with the "dynamic" exit criteria detection (as it is explained in the multiple ARM white papers on SVE)
I am looking for the similar explanation and/or example of the "usage model" for the SVE "non-fault" load instructions
As to my understanding "non-fault" means exactly this: No element load will produce a fault. But I am new to SVE, so I might be wrong.
Thanks for the reply. However, what I am looking for is not the "definition" of the instruction but rather the "usage scenario i.e. the explanation "why" the instruction has been introduced. In other words, what kind of the algorithms it is useful for.For instance,there are multiple available “white papers” which provide the examples of the “usage scenarios” for SVE “first -faulting” Load instructions (LDFF) (for instance, the vectorized strlen() implementation). However, it appears, that they do not provide the “usage scenarios” for SVE “non-faulting” Load instructions (LDNF).
I have updated the question to clarify what information I am looking for
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